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TH1991/TH1992 series precision source/measure units can output up to ±210V DC voltage, ±3A DC current and ±10.5A pulse current, minimum 10fA/100nV power supply and measurement resolution, support high-speed sampling, and can generate arbitrary waveforms.
TH1991/TH1992 series precision source/measure unit series adopts 7-inch capacitive touch screen, with Linux operating system as the bottom layer, interactive graphical user interface and various display modes, and built-in diodes, triodes, MOS tubes and IGBTs and other devices. The I/V curve scanning function can complete the IV function test without connecting to the host computer, which can significantly improve the test efficiency.
The TH1991/TH1992 series of precision source/measure units with comprehensive and integrated power and measurement functions are ideal for testing semiconductors, active/passive devices, and a variety of other devices and materials.
The TH1991/TH1992 series of precision source/measure units are widely used in R&D and educational applications, industrial development, testing and manufacturing.
Features
• 10fA current output and measurement resolution; 100nV voltage output and component resolution
• ±210V maximum voltage output; ±3.03A (DC)/±10.5A (pulse) maximum current output.
• Support DC, pulse, sweep and list output.
• Minimum sampling interval 1μs
• Built-in I/V curve sweep function, time-domain waveform scrolling display function
• The pulse width of the pulse output can be as small as 50μs
• Both two-wire measurement / four-wire measurement
• The output filter time constant (or cutoff frequency) can be freely set to achieve any frequency response output
• 14-level sorting function, including Grading and Sorting modes.
• Math operation function, moving average filter function, deviation subtraction function
• Semiconductor parameter analysis function to quickly generate characteristic curves of commonly used devices.
• Four basic modes of voltage source, current source, voltmeter, ammeter or resistance meter
• Delta low resistance test method, which can effectively compensate the measurement error caused by thermal electromotive force.
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