Semiconductor Parameter Analyzer Dual CPU Max Voltage 40V LCR 0.56ms 10 Bins

TH511 Semiconductor CV Analyzer: Dual CPU, Max.Voltage ±40V, LCR 0.56ms, 10 Bins

1. Application in Testing and Characterization: The DC Bias Current Source finds extensive use in testing and characterization of electronic components, such as transistors, diodes, integrated circuits (ICs), and sensors. It enables the assessment of device behavior under specific biasing conditions, facilitating the measurement of parameters like gain, linearity, leakage current, and threshold voltage. Additionally, it is employed in the calibration of measurement equipment, ensuring accurate and traceable results.

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Features

10.1-inch capacitive touch screen, resolution 1280*800, Linux system

Dual CPU architecture, the fastest test speed of LCR function is 0.56ms

Three test methods: spot test, list scan, and graphic scan (option)

Four parasitic parameters (Ciss, Coss, Crss, Rg) are measured and displayed on the same screen

CV curve scan, Ciss-Rg curve scan

Integrated design: LCR + VGS low voltage source + VDS high voltage source + channel switching + PC

Standard 2-channel test, which can test two devices or dual-chip devices at the same time, the channel can be expanded to 6, channel parameters are stored separately

Fast charging, shortens capacitor charging time and enables fast testing

Automatic delay setting

High Bias: VGS: 0 - ±40V, VDS: 0 - 200V/1500V/3000V

10 bin sorting

Applications

Semiconductor components/Power components

Parasitic capacitance test and C-V characteristic analysis of diodes, triodes, MOSFETs, IGBTs, thyristors, integrated circuits, optoelectronic chips, etc.

Semiconductor material

Wafer, C-V characteristic analysis

Liquid crystal material

Elastic constant analysis

Capacitive element

Capacitor C-V characteristic test and analysis, capacitive sensor test and analysis

Specifications