Send Message
Home > products > Micro Ohm Tester > Semiconductor Component Analyzer CV Dual CPU Architecture 10 Bin Sorting

Semiconductor Component Analyzer CV Dual CPU Architecture 10 Bin Sorting

Category:
Micro Ohm Tester
Specifications
Accuracy:
±0.1%
Data Storage:
2GB
Data Transfer:
USB 2.0
Dimension:
300mm*200mm*100mm
Display:
7-inch LCD
Humidity:
20-80%RH
Interface:
RS232/USB
Measurement Range:
0.1-100V
Operating Temperature:
0-50℃
Power Supply:
AC100-240V
Product Name:
CV Analyzer For Semiconductor
Resolution:
1mV
Sampling Rate:
1ms/point
Storage Temperature:
-20-60℃
Weight:
2.5Kg
Highlight:

semiconductor component analyzer

,

semiconductor analyzer

,

analyzer CV

Introduction

TH511 CV Analyzer For Semiconductor Dual CPU Architecture 10 Bin Sorting

  1. Precise and Adjustable Biasing: The DC Bias Current Source is designed to deliver a precise and adjustable bias current to electronic components or circuits. It allows users to set the desired current level accurately, ensuring consistent and controlled operation of the devices under test. The adjustable feature enables the selection of various biasing conditions, making it suitable for a wide range of applications.

  2. Stable and Constant Current Output: The DC Bias Current Source provides a stable and constant current output, maintaining a steady biasing condition for the connected components or circuits. This stability is crucial for accurate measurements, reliable performance, and consistent results. The source employs advanced circuitry and feedback mechanisms to regulate the output current, compensating for any variations in load or input voltage.

Feature
 
• 10.1-inch capacitive touch screen, resolution 1280*800, Linux system
• Dual CPU architecture , the fastest test speed of 0.56ms (1800 times/second)
• Three test methods: spot test, list scan, and graphic scan (option)
• Four parasitic parameters (Ciss, Coss, Crss, Rg) are measured and displayed on the same screen
• Integrated design: LCR + high voltage source + channel switching
• Standard 2-channel test, which can test two devices or dual-chip devices at the same time, the channel is the most Up to 6 channels can be expanded,channel parameters are stored separately
• Fast charging, shortens capacitor charging time and enables fast testing
• Fast turn-on test Conduction
• Automatic delay setting
• High Bias: VGS: 0 - ±40V, VDS: 0 - 200V/1500V
• 10 bin sorting

 

Brief Introduction

 

TH510 series semiconductor C-V characteristic analyzer is an analysis instrument designed by Changzhou Tonghui for semiconductor materials and components design and research.
TH510 series semiconductor C-V characteristic analyzer innovatively adopts new generation technologies such as dual CPU architecture, Linux underlying system, 10.1-inch capacitive touch screen, Chinese and English operation interface, built-in instruction and help, etc., It is suitable for fast and automatic integration and sorting of production lines and can meet laboratory research and development and analysis.
The design frequency of TH510 series semiconductor C-V characteristic analyzer is 1kHz-2MHz, the VGS voltage can reach ±40V, and the VDS voltage can reach 200V/1500V, which is enough to meet the CV characteristic test and analysis of semiconductor components such as conventional diodes, triodes, MOS tubes and IGBTs. Thanks to the 10.1-inch capacitive touch screen with a resolution of 1280*800, TH510 series semiconductor C-V characteristic analyzer can display four parameters on the same screen, all settings, monitoring, sorting parameters, status, etc.can be displayed on the same screen Display, avoiding the tedious operation of frequent switching.

  

Application
 
• Semiconductor components/Power components
Parasitic capacitance test and C-V characteristic analysis of diodes, triodes, MOSFETs, IGBTs, thyristors, integrated circuits, optoelectronic chips, etc.
• Semiconductor material
Wafer dicing, C-V characteristic analysis
• Liquid crystal material
Elastic constant analysis
 


Notable Features

 

A.Single-spot test, 10.1-inch large screen, four parasitic parameters are displayed on the same screen, so that the details can be seen at a glance.
10.1-inch touch screen, 1280*800 resolution,Linux system, Chinese and English operation interface, support keyboard, mouse, LAN
interface, which brings unparalleled operation convenience.
The four most important parasitic parameters of MOSFET: Ciss, Coss, Crss, Rg directly display the measurement results on the same
interface, and display the equivalent circuit diagram of the four parameters at the same time, which is clear at a glance.
Up to 6 channels of measurement parameters can be quickly recalled, and the sorting results are directly displayed on the same interface.
Semiconductor Component Analyzer CV Dual CPU Architecture 10 Bin Sorting
B.List scan, flflexible combination
 
TH510 series semiconductor C-V characteristic analyzer supports testing and analysis of up to 6 channels and 4 measurement parameters.
The list scan mode supports any combination of difffferent channels, difffferent parameters, and difffferent measurement conditions, and can set
the limit range and display the measurement results.
Semiconductor Component Analyzer CV Dual CPU Architecture 10 Bin Sorting
 
C.Graphic scan function (option)
 
TH510 series semiconductor C-V characteristic analyzer supports C-V characteristic curve analysis, can realize curve scanning in logarithmic and linear ways, and can display multiple curves at the same time: multiple curves with the same parameter and different Vg; multiple curves with the same Vg and difffferent parameters .

Semiconductor Component Analyzer CV Dual CPU Architecture 10 Bin Sorting

D.Simple and quick setup
 
The parameters can be selected arbitrarily and can be turned on and offff. Turning offff the parameters can effffectively save time
and data transmission; the delay time can be set automatically or by itself; the gate resistance can be selected from drain
source short-circuit or drain-source open circuit. Spot test setting inferface
Using a graphical setting interface, the function parameters correspond to the schematic settings at a glance
Semiconductor Component Analyzer CV Dual CPU Architecture 10 Bin SortingSemiconductor Component Analyzer CV Dual CPU Architecture 10 Bin Sorting
 
E.10 BINS sorting and programmable HANDLER interface
 
The instrument provides 10 grades of sorting, which provides the possibility for customer product quality classification,and the sorting results are directly output to the HANDLER interface.
When connecting with automation equipment, how to configure the output of the HANDLER interface has always been a diffiffifficult problem for automation customers. The TH510 series fully visualizes the pin position of the HANDLER interface, input and output methods, corresponding signals, and response methods, making automatic connection easier.
Semiconductor Component Analyzer CV Dual CPU Architecture 10 Bin Sorting
F.Support customization, intelligent fifirmware upgrade
 
Tonghui Instrument is open to customers. All interfaces and instruction sets of the instrument are open design. Customers
can program integration or customize functions by themselves. If there is no hardware change in customized functions, they can
be updated directly through fifirmware upgrade.
The instrument itself has perfect functions, BUG solutions, function upgrades, etc., can be updated by upgrading the fifirmware
(Firmware) without returning to the factory.
The fifirmware upgrade is very intelligent, which can be carried out through the system setting interface or the fifile management
interface, intelligently search the instrument memory, external USB flflash drive or even the upgrade package in the local area
network, and automatically upgrade.
Semiconductor Component Analyzer CV Dual CPU Architecture 10 Bin Sorting
G. Knowledge of parasitic capacitance of semiconductor components
 
In high-frequency circuits, the parasitic capacitance of semiconductor devices often affffects the dynamic characteristics of
semiconductors, so the following factors need to be considered when designing semiconductor components.
In the design of high-frequency circuits, it is often necessary to consider the inflfluence of the diode junction capacitance; the
parasitic capacitance of the MOS tube will affffect many aspects such as the operation time, driving ability and switching loss of
the tube; the voltage dependence of the parasitic capacitance is also in the circuit design. Crucially, take the MOSFET as an example.
Semiconductor Component Analyzer CV Dual CPU Architecture 10 Bin Sorting
Semiconductor Component Analyzer CV Dual CPU Architecture 10 Bin Sorting
Semiconductor Component Analyzer CV Dual CPU Architecture 10 Bin SortingSemiconductor Component Analyzer CV Dual CPU Architecture 10 Bin Sorting
Send RFQ
Stock:
MOQ: